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Sub-bottom profilers

3010-P Seabed Oretech

Surveys of geological structure in deeper sediment layers

Technical parameters:

  • Operates on one, two, or even three channels
  • Can detect small-diameter pipelines and subsea cables
  • Fully operational in shallow waters
  • Frequency: 3.5, 5, 7, 10, 14 kHz
  • Pulse length: 0.1, 0.2, 0.5, 1, and 2 ms
  • Depth range: 300 m
  • Resolution: frequency-dependent
  • Comes with a wave motion compensator

 

Boomer System

Surveys of geological structure in deeper sediment layers

The system includes:

  • Applied Acoustic AA251 Boomer Plate
  • SIG Pulse Energy Source


Technical parameters:

  • Frequencies from 300 Hz to 2500 Hz (impulse frequency 2 Hz)
  • Identification of layers with a resolution of approx. 60 cm
  • Identification of layers to the depth of 100 m below the seabed surface

 

EdgeTech X-Star

Surveys of geological structure in deeper sediment layers

Technical parameters:

  • Frequency range: 2–16 kHz
  • Pulse length: 20, 40 ms
  • Beam width: 15–20°
  • Measurement depth range: 300 m
  • Penetration:
  • – in coarse sediment: 10–20 m
  • – in fine sediments: 100–200 m
  • Resolution: 6–10 cm

 

Innomar SES-2000

Surveys of geological structure in deeper layers of sediments

Technical parameters:

  • Frequency range: 85–115 kHz
  • Pulse length: 0.07–1.0 ms (at choice)
  • Beam width: ±2°
  • Measurement depth range: 300 m
  • Penetration: up to 40 m (depending on the sediment grain size)
  • Resolution: 1–5 cm

 


INFORMATION AND ORDERS

phone: 601 055 461
elektro@im.umg.edu.pl
zamowienie@im.umg.edu.pl